Engineers involved in design, characterization and validation of USB2.0 devices face daily pressures to speed new products to the marketplace. USB2.0 designers need tools to properly characterize their designs and verify compliance to industry standards. Characterization of these electrical signals includes mask testing as well as parametric testing, up to 480 Mbps.
TDSUSB eliminates the tedium of manually setting up the oscilloscope by providing predefined oscilloscope setups for various tests. Users can quickly perform all USB-IF recommended tests, such as eye diagram and parametric testing for Low-speed, Full-speed and High-speed devices and hubs. The comprehensive test fixture supports a wide range of tests.
Quick Pass/Fail tests substantiated with results make the TDSUSB2 application the preferred solution for USB2.0 physical layer validation. In-depth analysis is possible with the statistical information about the tests performed. The user-defined measurement limits also help to perform tolerance testing on a design. |
