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Fully automatic, high-speed DC characterization of semiconductor devices
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Sourcing and measurement 50 fA to 100 mA and 1 mV to 100 V
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Up to 1140 measurement and display points for precise measurement and analysis
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Flexible graphic analysis for quick parameter extraction
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Floppy disk drive stores of 240 user programs or 105 measurement results
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HP-IB
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