TestEquity has long served as a partner to leading designers and manufacturers of semiconductor and other electronic components. We pride ourselves on being able to provide complete solutions for applications such as jitter and noise measurements, power measurements, EMI troubleshooting, and memory test.
RECENT APPLICATION NOTES
Characterization of PCB Insertion Loss with a New Calibration Method
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.
Semiconductor Device Test Applications Guide
Request your copy of Keithley's applications guide to semiconductor device test.
WaferPro Express Software
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.
The World's Highest Pin Count In-Circuit Test Solutions
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world's highest pin count ICT system, bringing an unprecedented level of performance and portability to users.
i3070 High Node Count Test Solution - Technical Overview
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system.
Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.
Passive Components Test Application Brief
The Anritsu VectorStar™ MS4640B Series offers the best VNA performance across the widest frequency bandwidth. Microwave capability from 70 kHz to 20/40/50 and 70 GHz, broadband measurements from 70 kHz to greater than 110 GHz, high accuracy time dom..
Using Markers to Estimate Noise Figure Application Note
Noise figure is a value that shows how much additional noise is added to a signal as the signal passes through a device. Pre-amplifiers are the devices that most commonly have specified values for noise figure. The noise added by a device permanently degrades the signal to noise ratio of a signal.
Keysight WaferPro Express
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
How to Extract SRAM Models
This video shows how to extract SRAM device models efficiently on Keysight's device modeling platform.