Signal Integrity Workshop at CATALYST 137 

Join TestEquity and Tektronix for a Free Workshop

Catalyst 137 Event
Tuesday, September 17, 2019

137 Glasgow St,
Kitchener, Ontario  N2G 4X8,

Registration 9 - 10 am
AM Session: 10am - 12 pm
Lunch: 12 - 1 pm
PM Session: 1pm - 3pm
Complimentary Lunch Included


Mark Walter
Applications Engineer,
Keithley Instruments

Blair Batty
Applications Engineer

Registration & Breakfast  

Display tables from Tektronix, TestEquity, Phoenix Contact, and Fluke will be available before, during and after the sessions.

AM Session
Investigating the Integrity of your Device Under Test

Time: 10-12pm
Presenter: Blair Battye
Presentation Topic:

In this session, we will be exploring the effects of Power and Noise on Signal Integrity and Jitter.  This presentation will review many of the typical analysis challenges related to power, noise and signal integrity investigation. Measurement methodology will be explained and several concepts will be illustrated via live demonstrations.

12- 1 pm 

PM Session:  
Overcoming DC measurement challenges

Time: 1 - 3 pm
Presenter: Mark Walter
Presentation Topic:

New semiconductor devices and materials are being created every day. Demands for smaller geometries, lower power consumption, and greater efficiency provide unique test challenges for the engineer. Selecting the appropriate instrument is key to accurate, repeatable measurements. In this session, we will explore the benefits and trade-offs of different types of bench instruments, to help you determine the right tool for the task at hand.



Join Us for a free seminar in Montreal and Ottawa.


Register Today - Space is Limited