Signal Integrity Workshop at CATALYST 137
Join TestEquity and Tektronix for a Free Workshop
Catalyst 137 Event
Tuesday, September 17, 2019
137 Glasgow St,
Kitchener, Ontario N2G 4X8,
Registration 9 - 10 am
AM Session: 10am - 12 pm
Lunch: 12 - 1 pm
PM Session: 1pm - 3pm
Complimentary Lunch Included
Registration & Breakfast
Display tables from Tektronix, TestEquity, Phoenix Contact, and Fluke will be available before, during and after the sessions.
Investigating the Integrity of your Device Under Test
Presenter: Blair Battye
In this session, we will be exploring the effects of Power and Noise on Signal Integrity and Jitter. This presentation will review many of the typical analysis challenges related to power, noise and signal integrity investigation. Measurement methodology will be explained and several concepts will be illustrated via live demonstrations.
12- 1 pm
Overcoming DC measurement challenges
Time: 1 - 3 pm
Presenter: Mark Walter
New semiconductor devices and materials are being created every day. Demands for smaller geometries, lower power consumption, and greater efficiency provide unique test challenges for the engineer. Selecting the appropriate instrument is key to accurate, repeatable measurements. In this session, we will explore the benefits and trade-offs of different types of bench instruments, to help you determine the right tool for the task at hand.
Join Us for a free seminar in Montreal and Ottawa.