Rohde & Schwarz ZNL3-COM Vector Network Analyzer Bundle 5 kHz to 3 GHz Frequency Range ZNL Series

32007.1 MFG #: ZNL3-COM
$27,770.00 / EA
  • Condition: New
  • Drill Down Description: Vector Network Analyzer Bundle, 5 kHz to 3 GHz Frequency Range, ZNL Series
  • Frequency: 5 kHz to 3 GHz
  • Model: ZNL3-COM
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  • Description
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    The MR Series high voltage multi-range DC power supplies consist of 250 V, 500 V, and 1000 V models producing 5 kW of clean output power in a compact 2U form factor. This series is suited for both bench use and automated test system applications. For benchtop applications, this series offers an intuitive user interface for list mode programming and slew rate adjustments directly from the front panel. System integrators benefit from fast command response times, excellent regulation, and low noise characteristics. This series supports USB, GPIB, LXI compliant LAN, and analog interfaces for remote control and programming. The provided LabVIEWTM, IVI-C, and IVI.NET drivers further simplify system development.

    The built-in SAS (solar array simulator) function enables users to generate PV (photovoltaic) I-V curves for testing solar inverters. Optional SAS software is available for simulating the I-V curve of different arrays under various weather and irradiance conditions.

    • Output up to 1000 V or 80 A
    • Multi-ranging operation, capable of replacing multiple fixed-range power supplies
    • 2U form factor saves rack space
    • Convenient single-phase AC input configuration
    • Fast command response time (10 ms)
    • Standard USB (USBTMC-compliant), RS232, GPIB, and LXI compliant LAN interfaces
    • Galvanically isolated analog control and monitoring interface
    • Overvoltage protection (OVP), overcurrent protection (OCP), overpower protection (OPP), overtemperature protection (OTP), foldback protection mode, and key-lock function
    • Adjustable voltage and current slope (rise and fall time)
    • Internal list mode programming
    • Built-in SAS (Solar Array Simulator) function to generate PV (photovoltaic) I-V curves
    • Parallel operation for increased output power
    • Control up to 30 power supplies from one PC with multi-unit control
    • Remote Sense to compensate for voltage drop
    • Soft panel software is included for remote control, test sequence generation, and data logging
    • cTUVus certification mark complies with UL and CSA safety standards

    The ZNL combines the functionality of a vector network analyzer, a spectrum analyzer and a power meter in a single, compact box. The all-in-one instrument is ideal for environments that involve constantly changing test requirements in development, production and service.

    Solid RF performance
    Vector network analyzers such as the ZNL can characterize electronic networks in the frequency domain, e.g. by measuring the magnitude and phase of S?parameters. Components can also be analyzed in the time domain with the ZNL-K2 option.

    High dynamic range
    The ZNL features a wide dynamic range of up to 130 dB (typ. at 10 Hz IFBW) and an output power of typ. 3 dBm. These values facilitate measurements on high rejection filters that call for a wide dynamic range. Low trace noise for high accuracy The ZNL offers low trace noise of less than 0.0005 dB (typ. at 10 kHz IFBW). This delivers stable, reproducible and precise measurements even at higher IF bandwidths. Using higher IF bandwidths, the ZNL can perform faster measurements while maintaining the stability normally only achieved with narrower IF bandwidths.

    Fast measurements for high throughput
    With measurement times of e.g. 16.7 ms for 401 points (full two-port calibration, 200 MHz span, 100 kHz IFBW), high-speed data processing and fast LAN or IEC/IEEE/GPIB data transfer, the R&S®ZNL meets the speed requirements encountered in production. Throughput can be maximized by using the segmented sweep function. Here, the frequency axis is divided into segments, and sweep parameters such as output power, IF bandwidth and number of points can be defined separately for each segment to optimally match the DUT characteristics. This increases measurement speed without any loss in accuracy.