The TDS8000 digital sampling oscilloscope offers the widest range of on-board measurement and waveform-processing capabilities of any ultra-high bandwidth oscilloscope. With excellent measurement repeatability, exceptional vertical resolution and fast waveform acquisition and display update rates, the TDS8000 is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages and cables and high-speed digital communications.
The TDS8000 Series state-of-the-art timebase provides equivalent time sweep speeds from 0.5 ps/div to 5 ms/div with record lengths from 20 to 4000 points and a sample interval of 10 femtoseconds (0.01 ps). In addition, TDS8000 Series sampling oscilloscopes' timebases can be locked to a 10 MHz reference providing greater long-term stability. This capability also allows multiple TDS8000s to be synchronized to other test equipment and/or the device-under-test.
- DC to 50 GHz Bandwidth
- Exceptional Trigger Jitter and Horizontal Timebase Stability
- Modular Architecture
- Up to Eight Channels Acquisition
- High Resolution and Measurement Repeatability
- Comprehensive, Accurate, Automatic Measurement System
- Intuitive User Interface
- Large Display (10.4 in.)
- Microsoft Windows-based Graphical User Interface