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QA Technology

QA Technology 100-PRN2519H Probe, 0.100 Center, 0.250 Full Stroke, Serrated, High SF, 100-25 Series

Our Part #10000747

Mfr Part #100-PRN2519H

QA Technology 100-PRN2519H
QA Technology

QA Technology 100-PRN2519H Probe, 0.100 Center, 0.250 Full Stroke, Serrated, High SF, 100-25 Series

Our Part #10000747

Condition:New

Mfr Part #100-PRN2519H

$2.10EACH

Condition:New

  • Conventional probe designed for loaded board testing.
  • 0.100 center and 0.250 full stroke probe, part of QA Technology's 100-25 Series.
  • High Spring Force (SF) made of stainless steel material with a 300,000 cycle life.
  • Serrated tip style (#19) for stability on a lead or post and to minimize side-loading but has limited contamination penetration.
  • Tube material "N" nickel silver/no finish improves wear properties and offers < 375 mOhms resistance.
  • Working temperature range of -55°C to 120°C with lubrication. SS springs can be used up to 204°C without lubrication.

The 100-PRN2519H a conventional probe designed for loaded board testing, brings reliability to your test floor as part of QA Technology's 100-25 Series. This probe offers a 0.100" center spacing and a 0.250" full stroke capability, the high force stainless steel spring ensures 300,000 cycles of dependable operation. Equipped with a Serrated tip (#19), it's ready for the job of minimizing side-loading. Internally, the tube maintains < 375 mOhms resistance for accurate measurements. Thanks to QA Technology's patented plunger geometry, you get reliable electrical contact every time. Works from -55°C to 120°C, or up to 204°C for unlubricated stainless steel springs.

Questions and Answers

There is no specific upper voltage limit defined for test probes or socket/termination pins. However, the spacing between probes and the dielectric strength of the probe plate must be evaluated. Probe plate materials that absorb moisture should be avoided. Apply test voltage to the fixture or DUT only after the fixture is engaged and the probes are fully compressed against the DUT. Energizing the probes before they make contact can cause arcing, which may damage or melt the probe tips.

Yes. Hipot testing, short for High Potential testing and also known as a Dielectric Withstanding Voltage (DWV) test, subjects a device to a voltage higher than its normal operating level. The purpose is to confirm that the device’s insulation can withstand this elevated voltage without breaking down, ensuring it provides adequate protection against electrical shock. This method is commonly applied to PCBs, transformers, electric motors, finished appliances, cables, and other wired or wireless assemblies.


BrandQA Technology
TypeProbe
Series100-25 Series
Centers0.100
Stroke Length0.250 Full Stroke
Tip StyleSerrated
Spring ForceHigh
MaterialNickel silver/no finish
Resistance< 375 MΩ
 
$2.10EACH