QA Technology X39-PRP2553H-S Probe, 0.039 Center, 0.250 Full Stroke, Chisel, High SF, X39-25 Series

• Socketless X Probe designed for loaded board testing.
• 0.039 center and 0.250 full stroke probe, part of QA Technology's X39-25 Series.
• High Spring Force (SF) made of stainless steel material with a 300,000 cycle life.
• Chisel tip style (#53) provides the highest penetrating pressure for reliable testing on flat or domed test pads.
• Features an S option for steel plunger construction.
• Tube material "P" nickel silver/id precious metal clad improves wear properties and offers < 20 mOhms resistance.
• Working temperature range of -55°C to 120°C with lubrication. SS springs can be used up to 204°C without lubrication.

QA Technology’s X39‑PRP2553H‑S (X39‑25 Series) probe simplifies board design. The X Probe Socketless design, eliminating the socket from the system, allows a more robust probe to be mounted on closer center compared to a standard probe and socket system. At a 0.039" center and a 0.250" stroke, you get high spring force backed by a 300,000-cycle lifespan. A Chisel tip (#53) provides the highest penetrating pressure. Low < 20 mOhms resistance ensures signal integrity throughout the tube. Factory lubrication and QA Technology's signature angled plunger design maximize cycle life. Safe for use between -55°C and 120°C.

Benefits of Socketless Design

• Large termination pin allows faster drill times.
• Solid termination pin does not wear out and provides increased durability.
• Reduces board manufacturing costs.
• A greater number of spring force and tip style selections.
• Available with all conventional wiring methods – end user friendly.
• Increased pointing accuracy helps improve first pass yields.

Questions and Answers

What is the maximum voltage that QA Technology test probes and sockets can carry?
There is no specific upper voltage limit defined for test probes or socket/termination pins. However, the spacing between probes and the dielectric strength of the probe plate must be evaluated. Probe plate materials that absorb moisture should be avoided. Apply test voltage to the fixture or DUT only after the fixture is engaged and the probes are fully compressed against the DUT. Energizing the probes before they make contact can cause arcing, which may damage or melt the probe tips.

Can QA Probes be used for Hipot testing?
Yes. Hipot testing, short for High Potential testing and also known as a Dielectric Withstanding Voltage (DWV) test, subjects a device to a voltage higher than its normal operating level. The purpose is to confirm that the device’s insulation can withstand this elevated voltage without breaking down, ensuring it provides adequate protection against electrical shock. This method is commonly applied to PCBs, transformers, electric motors, finished appliances, cables, and other wired or wireless assemblies.