QA Technology X39-PRP256RS-S Probe, 0.039 Center, 0.250 Full Stroke, Razor, Standard SF, X39-25 Series

• Socketless X Probe designed for loaded board testing.
• 0.039 center and 0.250 full stroke probe, part of QA Technology's X39-25 Series.
• Standard Spring Force (SF) made of musical wire material with a 1,000,000 cycle life.
• Razor tip style (#6R) is made with two sharp cutting edges to increase contact reliability on a wide variety of pasted pads and vias.
• Features an S option for steel plunger construction.
• Tube material "P" nickel silver/id precious metal clad improves wear properties and offers < 20 mOhms resistance.
• Working temperature range of -55°C to 120°C with lubrication. SS springs can be used up to 204°C without lubrication.

Built for simplification, the X39-PRP256RS-S in QA Technology's X39-25 Series lineup, features a Socketless X Probe design for loaded board testing. With a 0.039" center and a 0.250" stroke, it delivers standard spring force through musical wire construction, rated for 1,000,000 cycles. The Razor tip (#6R) handles your targets on a wide variety of pasted pads and vias. The tube construction keeps resistance < 20 mOhms while maximizing wear life. QA Technology's angled plunger tail design maintains consistent contact between cycles. Operating range: -55°C to 120°C (up to 204°C without lubrication for SS springs).

Benefits of Socketless Design

• Large termination pin allows faster drill times.
• Solid termination pin does not wear out and provides increased durability.
• Reduces board manufacturing costs.
• A greater number of spring force and tip style selections.
• Available with all conventional wiring methods – end user friendly.
• Increased pointing accuracy helps improve first pass yields.

Questions and Answers

What is the maximum voltage that QA Technology test probes and sockets can carry?
There is no specific upper voltage limit defined for test probes or socket/termination pins. However, the spacing between probes and the dielectric strength of the probe plate must be evaluated. Probe plate materials that absorb moisture should be avoided. Apply test voltage to the fixture or DUT only after the fixture is engaged and the probes are fully compressed against the DUT. Energizing the probes before they make contact can cause arcing, which may damage or melt the probe tips.

Can QA Probes be used for Hipot testing?
Yes. Hipot testing, short for High Potential testing and also known as a Dielectric Withstanding Voltage (DWV) test, subjects a device to a voltage higher than its normal operating level. The purpose is to confirm that the device’s insulation can withstand this elevated voltage without breaking down, ensuring it provides adequate protection against electrical shock. This method is commonly applied to PCBs, transformers, electric motors, finished appliances, cables, and other wired or wireless assemblies.