QA Technology X75-PRP2555H-S Probe, 0.075 Center, 0.250 Full Stroke, Crown, High SF, X75-25 Series

• Socketless X Probe designed for loaded board testing.
• 0.075 center and 0.250 full stroke probe, part of QA Technology's X75-25 Series.
• High Spring Force (SF) made of stainless steel material with a 300,000 cycle life.
• Crown tip style (#55) for small diameter leads requiring a self-cleaning crown tip geometry to prevent the lead from slipping through the valleys.
• Features an S option for steel plunger construction.
• Tube material "P" nickel silver/id precious metal clad improves wear properties and offers < 20 mOhms resistance.
• Working temperature range of -55°C to 120°C with lubrication. SS springs can be used up to 204°C without lubrication.

Reach for the X75-PRP2555H-S, from QA Technology's X75-25 Series, for its Socketless X Probe design used in loaded board testing. This probe offers a 0.075" center spacing and a 0.250" full stroke capability, its stainless steel spring provides high force and lasts up to 300,000 cycles. Its Crown tip design (#55) ensures prevention of the lead from slipping through the valleys. Expect < 20 mOhms resistance from its precision-engineered tube. The angled plunger tail, a QA Technology innovation, keeps internal contact consistent . Temperature rated from -55°C to 120°C with lubrication.

Benefits of Socketless Design

• Large termination pin allows faster drill times.
• Solid termination pin does not wear out and provides increased durability.
• Reduces board manufacturing costs.
• A greater number of spring force and tip style selections.
• Available with all conventional wiring methods – end user friendly.
• Increased pointing accuracy helps improve first pass yields.

Questions and Answers

What is the maximum voltage that QA Technology test probes and sockets can carry?
There is no specific upper voltage limit defined for test probes or socket/termination pins. However, the spacing between probes and the dielectric strength of the probe plate must be evaluated. Probe plate materials that absorb moisture should be avoided. Apply test voltage to the fixture or DUT only after the fixture is engaged and the probes are fully compressed against the DUT. Energizing the probes before they make contact can cause arcing, which may damage or melt the probe tips.

Can QA Probes be used for Hipot testing?
Yes. Hipot testing, short for High Potential testing and also known as a Dielectric Withstanding Voltage (DWV) test, subjects a device to a voltage higher than its normal operating level. The purpose is to confirm that the device’s insulation can withstand this elevated voltage without breaking down, ensuring it provides adequate protection against electrical shock. This method is commonly applied to PCBs, transformers, electric motors, finished appliances, cables, and other wired or wireless assemblies.