QA Technology 100-PRP2541H-N Probe, 0.100 Center, 0.250 Full Stroke, Spear, High SF, 100-25 Series

• Conventional probe designed for loaded board testing.
• 0.100 center and 0.250 full stroke probe, part of QA Technology's 100-25 Series.
• High Spring Force (SF) made of stainless steel material with a 300,000 cycle life.
• Spear tip style (#41) for spear tip is used when the rim of the hole must remain free of marks.
• "-N" No probe lubrication option. Removing lubrication greatly reduces cycle life and should only be used in applications outside of the working temperature range.
• Tube material "P" nickel silver/id precious metal clad improves wear properties and offers < 20 mOhms resistance.
• Working temperature range of -55°C to 120°C with lubrication. SS springs can be used up to 204°C without lubrication.

The 100-PRP2541H-N from QA Technology's 100-25 Series is a conventional probe designed for loaded board testing. This probe offers a 0.100" center spacing and a 0.250" full stroke capability, its stainless steel spring provides high force and lasts up to 300,000 cycles. Its Spear tip design (#41) ensures reliable contact for a mark free rim. Expect < 20 mOhms resistance from its precision-engineered tube. Available without lubrication, denoted by option -N, for use in temperatures outside of the working range. The angled plunger tail, a QA Technology innovation, keeps internal contact consistent . Temperature rated from -55°C to 120°C with lubrication, 120°C to 204°C with option -N.

Questions and Answers

What is the maximum voltage that QA Technology test probes and sockets can carry?
There is no specific upper voltage limit defined for test probes or socket/termination pins. However, the spacing between probes and the dielectric strength of the probe plate must be evaluated. Probe plate materials that absorb moisture should be avoided. Apply test voltage to the fixture or DUT only after the fixture is engaged and the probes are fully compressed against the DUT. Energizing the probes before they make contact can cause arcing, which may damage or melt the probe tips.

Can QA Probes be used for Hipot testing?
Yes. Hipot testing, short for High Potential testing and also known as a Dielectric Withstanding Voltage (DWV) test, subjects a device to a voltage higher than its normal operating level. The purpose is to confirm that the device’s insulation can withstand this elevated voltage without breaking down, ensuring it provides adequate protection against electrical shock. This method is commonly applied to PCBs, transformers, electric motors, finished appliances, cables, and other wired or wireless assemblies.