QA Technology X50-PRP4076H Probe, 0.050 Center, 0.400 Full Stroke, Center Point Star, X50-25 Series

• Socketless X Probe designed for dual level, loaded board testing.
• 0.050 center and 0.400 full stroke probe, part of QA Technology's X50-40 Series.
• High Spring Force (SF) made of stainless steel material with a 300,000 cycle life.
• Center Point Star tip style (#76) has sharp radial cutting edges along with a sharp center point for difficult no-clean flux processes.
• Tube material "P" nickel silver/id precious metal clad improves wear properties and offers < 20 mOhms resistance.
• Working temperature range of -55°C to 120°C with lubrication. SS springs can be used up to 204°C without lubrication.

The X50-PRP4076H from QA Technology's X50-40 Series delivers for dual level, loaded board testing. Its X Probe Socketless design, eliminates the socket from the system, allowing a more robust probe to be mounted on closer centers compared to a standard probe and socket system. At 0.050" center and 0.400" stroke, its stainless steel spring provides high force and lasts up to 300,000 cycles. Its Point Star tip design (#76) provides ease for difficult no-clean flux processes. Expect < 20 mOhms resistance from its precision-engineered tube. The angled plunger tail, a QA Technology innovation, keeps internal contact consistent . Temperature rated from -55°C to 120°C with lubrication.

Questions and Answers

What is the maximum voltage that QA Technology test probes and sockets can carry?
There is no specific upper voltage limit defined for test probes or socket/termination pins. However, the spacing between probes and the dielectric strength of the probe plate must be evaluated. Probe plate materials that absorb moisture should be avoided. Apply test voltage to the fixture or DUT only after the fixture is engaged and the probes are fully compressed against the DUT. Energizing the probes before they make contact can cause arcing, which may damage or melt the probe tips.

Can QA Probes be used for Hipot testing?
Yes. Hipot testing, short for High Potential testing and also known as a Dielectric Withstanding Voltage (DWV) test, subjects a device to a voltage higher than its normal operating level. The purpose is to confirm that the device’s insulation can withstand this elevated voltage without breaking down, ensuring it provides adequate protection against electrical shock. This method is commonly applied to PCBs, transformers, electric motors, finished appliances, cables, and other wired or wireless assemblies.