QA Technology 050-PRP2514H-S Probe, 0.050 Center, 0.250 Full Stroke, Crown, High SF, 050-R25 Series

• Conventional probe designed for loaded board testing.
• 0.050 center and 0.250 full stroke probe, part of QA Technology's 050-R25 Series.
• High Spring Force (SF) made of stainless steel material with a 300,000 cycle life.
• Crown tip style (#14) is recommended when using a pin‑testable flux. A self‑cleaning crown or other multi‑point tip with valleys helps prevent contamination from building up.
• Features an S option for steel plunger construction.
• Tube material "P" nickel silver/id precious metal clad improves wear properties and offers < 20 mOhms resistance.
• Working temperature range of -55°C to 120°C with lubrication. SS springs can be used up to 204°C without lubrication.

QA Technology probe 050-PRP2514H-S (050-R25 Series) is designed for loaded board testing. Configured at 0.050" center with a 0.250" stroke, you get high spring force backed by a 300,000-cycle lifespan. A Crown tip (#14) is recommended when using a pin‑testable flux. Low < 20 mOhms resistance ensures signal integrity throughout the tube. Factory lubrication and QA Technology's signature angled plunger design maximize cycle life. Safe for use between -55°C and 120°C.

Questions and Answers

What is the maximum voltage that QA Technology test probes and sockets can carry?
There is no specific upper voltage limit defined for test probes or socket/termination pins. However, the spacing between probes and the dielectric strength of the probe plate must be evaluated. Probe plate materials that absorb moisture should be avoided. Apply test voltage to the fixture or DUT only after the fixture is engaged and the probes are fully compressed against the DUT. Energizing the probes before they make contact can cause arcing, which may damage or melt the probe tips.

Can QA Probes be used for Hipot testing?
Yes. Hipot testing, short for High Potential testing and also known as a Dielectric Withstanding Voltage (DWV) test, subjects a device to a voltage higher than its normal operating level. The purpose is to confirm that the device’s insulation can withstand this elevated voltage without breaking down, ensuring it provides adequate protection against electrical shock. This method is commonly applied to PCBs, transformers, electric motors, finished appliances, cables, and other wired or wireless assemblies.