• Conventional probe designed for bare board testing.
• 0.100 center and 0.050 full stroke probe, part of QA Technology's 100-05 Series.
• Low Spring Force (SF) made of stainless steel material with a 1,000,000 cycle life.
• Round tip style (#30) is used for gold plated pads to minimize marking.
• Features Long plunger (-L) option.
• Tube material "N" nickel silver/no finish improves wear properties and offers < 65 mOhms resistance.
• Working temperature range of -55°C to 120°C with lubrication. SS springs can be used up to 204°C without lubrication.

The 100-PLN0530L in QA Technology's 100-05 Series is a conventional probe designed for bare board testing. Configured at 0.100" center with a 0.050" stroke, the low force stainless steel spring ensures 1,000,000 cycles of dependable operation. Equipped with a Round tip (#30), it's used for gold plated pads to minimize marking. Internally, the tube maintains < 65 mOhms resistance for accurate measurements. This model features an extended plunger for reaching recessed targets. Thanks to QA Technology's patented plunger geometry, you get reliable electrical contact every time. Works from -55°C to 120°C, or up to 204°C for unlubricated stainless steel springs.

Questions and Answers

What is the maximum voltage that QA Technology test probes and sockets can carry?
There is no specific upper voltage limit defined for test probes or socket/termination pins. However, the spacing between probes and the dielectric strength of the probe plate must be evaluated. Probe plate materials that absorb moisture should be avoided. Apply test voltage to the fixture or DUT only after the fixture is engaged and the probes are fully compressed against the DUT. Energizing the probes before they make contact can cause arcing, which may damage or melt the probe tips.

Can QA Probes be used for Hipot testing?
Yes. Hipot testing, short for High Potential testing and also known as a Dielectric Withstanding Voltage (DWV) test, subjects a device to a voltage higher than its normal operating level. The purpose is to confirm that the device’s insulation can withstand this elevated voltage without breaking down, ensuring it provides adequate protection against electrical shock. This method is commonly applied to PCBs, transformers, electric motors, finished appliances, cables, and other wired or wireless assemblies.