QA Technology 100-PRP2554Y Probe, 250 Stroke, Crown Tip, Elevated Spring Force, 100-25 Series

• 0.100" (2.54 mm) center spacing, part of QA Technology’s 100-25 Series designed for PCBs.
  
• 0.250" (6.35 mm) full stroke, for in‑circuit and functional (ICT/FCT) testing.
  
• Elevated spring force (SF) made of of high-strength music wire (MW) and with a 1,000,000 cycle life.
  
• Crown tip (#54) with 0.012 tip diameter 50° angle in heat treated BeCu/gold plated over nickel.
  
• Nickel silver/ID precious metal clad tube providing < 15 mOhms average resistance.
  
• Working Temperature Range: -55°C to 120°C with lubrication. Stainless steel (SS) springs can be used up to 204°C without lubrication.

The QA Technology 100-PRP2554Y is a test probe with an elevated spring‑force from the 100-25 Series, built for reliable in‑circuit testing (ICT) and functional testing (FCT) on loaded circuit boards. Its high‑conductivity, proprietary metal alloys and platings enable the series to carry higher electrical currents than standard probes. For flat pads or solder domes, reduced crown tips like #54 may be considered to prevent sliding off the target.

About QA Probes
QA Technology's patented probe design features an angled plunger tail for improved biasing ensuring consistent electrical contact between the internal sliding surfaces of the plunger and probe. They are also lubricated to maximize cycle life and performance. Unlubricated probes (option N) are available if required. Removing lubrication greatly reduces cycle life and should only be used in applications outside of the working temperature range.