Tektronix MSMU200-2 Source Measure Unit (SMU) Module, 2 Channel, 30W, 200V, 1.5A, MP5000 Series

Tektronix MSMU200-2 2 Channel Source Measure Unit (SMU) Modules, MP5000 Series

SMU Modules

• Tektronix’s latest SMU design; includes improvements over Series 2600B SMUs

• Modular form factor allows for 4x density increase for SMUs

Specifications:

• MSMU60-2: 2 Channel, 30 W, 60 V, 1.5 A

• MSMU200-2: 2 Channel, 30 W, 200 V, 1.5 A (with extended range pulse)

• Measurement Resolution: Down to femtoampere (fA) level

• Digitizer: 1 MSa/s ADC for voltage and current

Features:

• Density: 2 CH/module

• V & I: Up to 200V & 5A (Pulse)

• V & I Protections: Built-in SMU

• Contact Check: Yes, HW circuitry

• Asymmetric Compliance: Yes

• Digital Capabilities: No, Future module

• Digital Tuning: Limited tuning for post RP1

Key Features & Benefits:

• 2 SMU channels per module, 6 channels per mainframe

• Up to 200 V and up to 1.5 A per channel

• Offers 4-quadrant voltage/current source and measure for each channel with 6½-digit measure resolution down to 100 femtoamps

• Integrated 1 MSa/s ADCs for both voltage and current measurements using fast sample rates

• Up to 6 V between force and sense allowing users more flexibility in cabling and test setup

• User selectable auto-sense resistor prevents excessive voltage at Force Hi if there are contact errors

• Asymmetric Compliance: Configure independent positive and negative limit values

Software
INTUITIVE, INTERACTIVE, INTERFACE

• Intuitive Web Interface: A highly visual, interactive Web UI display designed for troubleshooting multi-channel setups and remote instrument monitoring

• TSP Toolkit: Facilitates the development of Test Script Processor (TSP™) scripts for automation within the widely-used Microsoft Visual Studio Code (VS Code) editor. More information and downloads found on the TSP Toolkit Product Page

• Supporting Drivers: Accelerate software development with drivers such as Python and IVI

The MP5000 Series is Tektronix’s next-generation modular precision test platform engineered to meet the evolving demands of automated test equipment (ATE) in validation and production workflows. Designed with a compact 1U form factor that supports up to six SMU or PSU channels per chassis and scales to 192 channels in parallel, native Python drivers, and the intuitive TSP Toolkit IDE, it delivers unmatched flexibility, performance, and automation for semiconductor, optoelectronics, and mission-critical applications.

Customers can mix and match module configurations to optimize cost, throughput, and accuracy. For applications where low current measurements and sinking capabilities aren't required, power supplies can be a cost-effective solution. For applications in which true current sourcing and high-speed measurements are required, consider an SMU module. The system supports a wide array of applications, and its high-density design conserves valuable rack space and reduces cost per channel. It's engineered to deliver fast throughput for high-channel parallel testing, saving both cost and time for production and validation test users.

In The Box

Included with SMU Modules:

• 4x Screw Terminal Block 4 Position Male Connector

Software & Drivers:

• TSP Toolkit (Base Version) – Visual Studio Code-based IDE

• Python & IVI Drivers

• Utilize TSP commands

• Access to Online Documentation and Example Scripts

FAQs: Frequently Asked Questions

1) What applications is the MSMU200-2 designed for?
The MSMU200-2 is ideal for semiconductor characterization, device validation, low-current measurements, and precision source-and-measure applications requiring high accuracy.

2) Can the MSMU200-2 source and measure simultaneously?
Yes. Each channel can precisely source voltage or current while simultaneously measuring electrical response, simplifying device characterization and automated testing.

3) Why choose an SMU instead of a traditional power supply?
An SMU combines precision sourcing and measurement in a single instrument, making it ideal for applications requiring low-current sensitivity, detailed device analysis, and accurate test results.